<?xml version="1.0"?>
<cd:Record xmlns:cd="http://www.stcorp.nl/coda/definition/2008/07" xmlns:ct="http://www.stcorp.nl/coda/test/2008/10" name="Auxiliary_Calibration_DCC_03_06" format="xml" namexml="Auxiliary_Calibration_DCC" last-modified="2017-04-12">
  <cd:Description>Auxiliary Calibration DCC</cd:Description>
  <cd:Field name="List_of_Data_Set_Records">
    <cd:Record namexml="List_of_Data_Set_Records">
      <cd:Description>List of Data Set Records</cd:Description>
      <cd:Attribute name="count">
      </cd:Attribute>
      <cd:Field name="Data_Set_Record">
        <cd:Array>
          <cd:Dimension/>
          <cd:Record namexml="Data_Set_Record">
            <cd:Description>Data Set Record</cd:Description>
            <cd:Field name="First_Start_of_Observation_Time">
              <cd:Type namexml="First_Start_of_Observation_Time">
                <cd:Time format="ascii" timeformat="ascii_ccsds_datetime_ymd1_with_ref">
                  <cd:Description>Start of observation time of the first BRC</cd:Description>
                  <cd:Mapping string="UTC=0000-00-00T00:00:00" value="-inf"/>
                  <cd:Mapping string="UTC=9999-99-99T99:99:99" value="+inf"/>
                </cd:Time>
              </cd:Type>
            </cd:Field>
            <cd:Field name="Last_Start_of_Observation_Time">
              <cd:Type namexml="Last_Start_of_Observation_Time">
                <cd:Time format="ascii" timeformat="ascii_ccsds_datetime_ymd1_with_ref">
                  <cd:Description>Start of observation time of the last BRC</cd:Description>
                  <cd:Mapping string="UTC=0000-00-00T00:00:00" value="-inf"/>
                  <cd:Mapping string="UTC=9999-99-99T99:99:99" value="+inf"/>
                </cd:Time>
              </cd:Type>
            </cd:Field>
            <cd:Field name="Mie_Dark_Current_Calibration_Result">
              <cd:Record namexml="Mie_Dark_Current_Calibration_Result">
                <cd:Description>Mie Dark Current Calibration Result</cd:Description>
                <cd:Field name="Mean_Measurement_Dark_Signal">
                  <cd:Type namexml="Mean_Measurement_Dark_Signal">
                    <cd:Attribute name="unit">
                      <cd:Optional/>
                      <cd:FixedValue>AU</cd:FixedValue>
                    </cd:Attribute>
                    <cd:Float format="ascii">
                      <cd:Description>Mean measurement dark signal over ACCD useful zone</cd:Description>
                      <cd:Unit>AU</cd:Unit>
                      <cd:NativeType>double</cd:NativeType>
                    </cd:Float>
                  </cd:Type>
                </cd:Field>
                <cd:Field name="Dark_Signal_Non_Uniformity">
                  <cd:Type namexml="Dark_Signal_Non_Uniformity">
                    <cd:Attribute name="unit">
                      <cd:Optional/>
                      <cd:FixedValue>AU</cd:FixedValue>
                    </cd:Attribute>
                    <cd:Float format="ascii">
                      <cd:Description>Dark signal non uniformity standard deviation</cd:Description>
                      <cd:Unit>AU</cd:Unit>
                      <cd:NativeType>double</cd:NativeType>
                    </cd:Float>
                  </cd:Type>
                </cd:Field>
                <cd:Field name="Mean_Measurement_Noise">
                  <cd:Type namexml="Mean_Measurement_Noise">
                    <cd:Attribute name="unit">
                      <cd:Optional/>
                      <cd:FixedValue>AU</cd:FixedValue>
                    </cd:Attribute>
                    <cd:Float format="ascii">
                      <cd:Description>Mean measurement noise over ACCD useful zone</cd:Description>
                      <cd:Unit>AU</cd:Unit>
                      <cd:NativeType>double</cd:NativeType>
                    </cd:Float>
                  </cd:Type>
                </cd:Field>
                <cd:Field name="List_of_Measurement_Dark_Signals">
                  <cd:Record namexml="List_of_Measurement_Dark_Signals">
                    <cd:Description>Map (Num_Measurement_Map_Image_Pixel_Rows * Num_Measurement_Map_Image_Pixel_Cols) of measurement pixel dark signals. Element (i,j) at image pixel row i, and image pixel column index j, is at Num_Measurement_Map_Image_Pixel_Cols*(i-1) + j position in the list</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="Measurement_Dark_Signal">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="Measurement_Dark_Signal">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>AU</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>Measurement pixel dark signal averaged over observations</cd:Description>
                            <cd:Unit>AU</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
                <cd:Field name="List_of_Measurement_Noises">
                  <cd:Record namexml="List_of_Measurement_Noises">
                    <cd:Description>Map (Num_Measurement_Map_Image_Pixel_Rows * Num_Measurement_Map_Image_Pixel_Cols) of measurement pixel noise. Element (i,j) at image pixel row i, and image pixel column index j, is at Num_Measurement_Map_Image_Pixel_Cols*(i-1) + j position in the list</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="Measurement_Noise">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="Measurement_Noise">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>AU</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>Measurement pixel noise averaged over observations</cd:Description>
                            <cd:Unit>AU</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
                <cd:Field name="List_of_ACCD_Die_Temperatures">
                  <cd:Record namexml="List_of_ACCD_Die_Temperatures">
                    <cd:Description>List of ACCD die temperature during the acquisition</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="ACCD_Die_Temperature">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="ACCD_Die_Temperature">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>C</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>ACCD die temperature average over a BRC</cd:Description>
                            <cd:Unit>degC</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
                <cd:Field name="List_of_Mean_Offset_Measurement_Observations">
                  <cd:Record namexml="List_of_Mean_Offset_Measurement_Observations">
                    <cd:Description>Average offset per observation.  Map (Num_Measurement_Map_Image_Pixel_Rows * Num_Observation_Map) of average image pixel row offsets. Element (i,m) at image pixel row i, and observation index m, is at Num_Observation_Map *(i-1) + m position in the list.</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="Mean_Offset_Measurement_Observation">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="Mean_Offset_Measurement_Observation">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>AU</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>Average measurement offset per observation</cd:Description>
                            <cd:Unit>AU</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
                <cd:Field name="List_of_Mean_Offset_Measurements">
                  <cd:Record namexml="List_of_Mean_Offset_Measurements">
                    <cd:Description>Average of each image pixel row over the entire calibration period</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="Mean_Offset_Measurement">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="Mean_Offset_Measurement">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>AU</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>Average measurement offset over all observations</cd:Description>
                            <cd:Unit>AU</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
              </cd:Record>
            </cd:Field>
            <cd:Field name="Rayleigh_Dark_Current_Calibration_Result">
              <cd:Record namexml="Rayleigh_Dark_Current_Calibration_Result">
                <cd:Description>Rayleigh Dark Current Calibration Result</cd:Description>
                <cd:Field name="Mean_Measurement_Dark_Signal">
                  <cd:Type namexml="Mean_Measurement_Dark_Signal">
                    <cd:Attribute name="unit">
                      <cd:Optional/>
                      <cd:FixedValue>AU</cd:FixedValue>
                    </cd:Attribute>
                    <cd:Float format="ascii">
                      <cd:Description>Mean measurement dark signal over ACCD useful zone</cd:Description>
                      <cd:Unit>AU</cd:Unit>
                      <cd:NativeType>double</cd:NativeType>
                    </cd:Float>
                  </cd:Type>
                </cd:Field>
                <cd:Field name="Dark_Signal_Non_Uniformity">
                  <cd:Type namexml="Dark_Signal_Non_Uniformity">
                    <cd:Attribute name="unit">
                      <cd:Optional/>
                      <cd:FixedValue>AU</cd:FixedValue>
                    </cd:Attribute>
                    <cd:Float format="ascii">
                      <cd:Description>Dark signal non uniformity standard deviation</cd:Description>
                      <cd:Unit>AU</cd:Unit>
                      <cd:NativeType>double</cd:NativeType>
                    </cd:Float>
                  </cd:Type>
                </cd:Field>
                <cd:Field name="Mean_Measurement_Noise">
                  <cd:Type namexml="Mean_Measurement_Noise">
                    <cd:Attribute name="unit">
                      <cd:Optional/>
                      <cd:FixedValue>AU</cd:FixedValue>
                    </cd:Attribute>
                    <cd:Float format="ascii">
                      <cd:Description>Mean measurement noise over ACCD useful zone</cd:Description>
                      <cd:Unit>AU</cd:Unit>
                      <cd:NativeType>double</cd:NativeType>
                    </cd:Float>
                  </cd:Type>
                </cd:Field>
                <cd:Field name="List_of_Measurement_Dark_Signals">
                  <cd:Record namexml="List_of_Measurement_Dark_Signals">
                    <cd:Description>Map (Num_Measurement_Map_Image_Pixel_Rows * Num_Measurement_Map_Image_Pixel_Cols) of measurement pixel dark signals. Element (i,j) at image pixel row i, and image pixel column index j, is at Num_Measurement_Map_Image_Pixel_Cols*(i-1) + j position in the list</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="Measurement_Dark_Signal">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="Measurement_Dark_Signal">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>AU</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>Measurement pixel dark signal averaged over observations</cd:Description>
                            <cd:Unit>AU</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
                <cd:Field name="List_of_Measurement_Noises">
                  <cd:Record namexml="List_of_Measurement_Noises">
                    <cd:Description>Map (Num_Measurement_Map_Image_Pixel_Rows * Num_Measurement_Map_Image_Pixel_Cols) of measurement pixel noise. Element (i,j) at image pixel row i, and image pixel column index j, is at Num_Measurement_Map_Image_Pixel_Cols*(i-1) + j position in the list</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="Measurement_Noise">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="Measurement_Noise">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>AU</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>Measurement pixel noise averaged over observations</cd:Description>
                            <cd:Unit>AU</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
                <cd:Field name="List_of_ACCD_Die_Temperatures">
                  <cd:Record namexml="List_of_ACCD_Die_Temperatures">
                    <cd:Description>List of ACCD die temperature during the acquisition</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="ACCD_Die_Temperature">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="ACCD_Die_Temperature">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>C</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>ACCD die temperature average over a BRC</cd:Description>
                            <cd:Unit>degC</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
                <cd:Field name="List_of_Mean_Offset_Measurement_Observations">
                  <cd:Record namexml="List_of_Mean_Offset_Measurement_Observations">
                    <cd:Description>Average offset per observation. Map (Num_Measurement_Map_Image_Pixel_Rows * Num_Observation_Map) of average image pixel row offsets. Element (i,m) at image pixel row i, and observation index m, is at Num_Observation_Map *(i-1) + m position in the list</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="Mean_Offset_Measurement_Observation">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="Mean_Offset_Measurement_Observation">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>AU</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>Average measurement offset per observation</cd:Description>
                            <cd:Unit>AU</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
                <cd:Field name="List_of_Mean_Offset_Measurements">
                  <cd:Record namexml="List_of_Mean_Offset_Measurements">
                    <cd:Description>Average of each image pixel row over the entire calibration period</cd:Description>
                    <cd:Attribute name="count">
                    </cd:Attribute>
                    <cd:Field name="Mean_Offset_Measurement">
                      <cd:Array>
                        <cd:Dimension/>
                        <cd:Type namexml="Mean_Offset_Measurement">
                          <cd:Attribute name="unit">
                            <cd:Optional/>
                            <cd:FixedValue>AU</cd:FixedValue>
                          </cd:Attribute>
                          <cd:Float format="ascii">
                            <cd:Description>Average measurement offset over all observations</cd:Description>
                            <cd:Unit>AU</cd:Unit>
                            <cd:NativeType>double</cd:NativeType>
                          </cd:Float>
                        </cd:Type>
                        <ct:NamedTest id="ValueOfCountAttributeForParent"/>
                      </cd:Array>
                    </cd:Field>
                  </cd:Record>
                </cd:Field>
              </cd:Record>
            </cd:Field>
            <cd:Field name="Num_Measurement_Map_Image_Pixel_Rows">
              <cd:Type namexml="Num_Measurement_Map_Image_Pixel_Rows">
                <cd:Integer format="ascii">
                  <cd:Description>Number of image pixel rows in the measurement map list</cd:Description>
                  <cd:NativeType>int16</cd:NativeType>
                </cd:Integer>
              </cd:Type>
            </cd:Field>
            <cd:Field name="Num_Measurement_Map_Image_Pixel_Cols">
              <cd:Type namexml="Num_Measurement_Map_Image_Pixel_Cols">
                <cd:Integer format="ascii">
                  <cd:Description>Number of image pixel columns in the measurement map list</cd:Description>
                  <cd:NativeType>int16</cd:NativeType>
                </cd:Integer>
              </cd:Type>
            </cd:Field>
            <cd:Field name="Operational_Mode">
              <cd:Text namexml="Operational_Mode">
                <cd:Description>Value to indicate if the laser was on, off or a mix for all the observations within DCC mode</cd:Description>
              </cd:Text>
            </cd:Field>
          </cd:Record>
          <ct:NamedTest id="ValueOfCountAttributeForParent"/>
        </cd:Array>
      </cd:Field>
    </cd:Record>
  </cd:Field>
</cd:Record>
